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Off-line Test Selection with Test Purposes for Non-Deterministic Timed Automata.

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https://hal.inria.fr/inria-00629177
Contributor : Amélie Stainer Connect in order to contact the contributor
Submitted on : Wednesday, October 5, 2011 - 12:01:56 PM
Last modification on : Friday, February 4, 2022 - 3:15:56 AM

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  • HAL Id : inria-00629177, version 1

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Nathalie Bertrand, Thierry Jéron, Amélie Stainer, Moez Krichen. Off-line Test Selection with Test Purposes for Non-Deterministic Timed Automata.. 17th International Conference on Tools and Algorithms for the Construction and Analysis of Systems (TACAS'11), Mar 2011, Saarbrücken, Germany. pp. 96-111. ⟨inria-00629177⟩

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