Testing Systems Specified as Partial Order Input\slashOutput Automata

Abstract : An Input/Output Automaton is an automaton with a finite number of states where each transition is associated with a single inpuf or output interaction. In [1], we introduced a new formalism, in which each transition is associated with a bipartite partially ordered set made of concurrent inputs followed by concurrent outputs. In this paper, we generalize this model to Partial Order Input/Output Automata (POIOA), in which each transition is associated with an almost arbitrary partially ordered set of inputs and outputs. This formalism can be seen as High-Level Messages Sequence Charts with inputs and outputs and allows for the specification of concurrency between inputs and outputs in a very general, direct and concise way. We give a formal definition of this framework, and define several conformance relations for comparing system specifications expressed in this formalism. Then we show how to derive a test suite that guarantees to detect faults defined by a POIOA-specific fault model: missing output faults, unspecified output faults, weaker precondition faults, stronger precondition faults and transfer faults.
Type de document :
Communication dans un congrès
Suzuki, Kenji and Higashino, Teruo and Ulrich, Andreas and Hasegawa, Toru. Proceedings of the 20th IFIP TC 6/WG 6.1 International Conference on Testing of Software and Communicating Systems (TestCom'08) and 8th International Workshop on Formal Approaches to Testing of Software (FATES'08), 2008, Tokyo, Japan, Japan. Springer, 5047, pp.169-183, 2008, 〈10.1007/978-3-540-68524-1_13〉
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https://hal.inria.fr/inria-00638305
Contributeur : Stefan Haar <>
Soumis le : vendredi 4 novembre 2011 - 15:05:31
Dernière modification le : jeudi 11 janvier 2018 - 06:20:08

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Gregor Von Bochmann, Stefan Haar, Claude Jard, Guy-Vincent Jourdan. Testing Systems Specified as Partial Order Input\slashOutput Automata. Suzuki, Kenji and Higashino, Teruo and Ulrich, Andreas and Hasegawa, Toru. Proceedings of the 20th IFIP TC 6/WG 6.1 International Conference on Testing of Software and Communicating Systems (TestCom'08) and 8th International Workshop on Formal Approaches to Testing of Software (FATES'08), 2008, Tokyo, Japan, Japan. Springer, 5047, pp.169-183, 2008, 〈10.1007/978-3-540-68524-1_13〉. 〈inria-00638305〉

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