The present study deals with active-matrix OLED microdisplays, based on a white top-emitting bi-emitters structure. The optimization of these devices lifetime is the main point of this manuscript. The luminous efficiency loss and the voltage drift induced while ageing of the device under constant current driving conditions are indeed key parameters. A first part consists in understanding the main degradation mechanisms known to operate in OLED devices. A focus on intrinsic mechanisms is here chosen to improve devices lifetime. Extrinsic mechanisms like encapsulation issues or other process optimization are not developed in this work. We propose here a systematic study on the influence of OLED structure parameters on initial but especially on aging performances. The optimization of anode electrical contact through plasma treatments and a thin oxide interlayer show very interesting results for reducing operating bias and voltage drift induced while aging under constant current. The enhancement of doping percentage in doped injection layers also show significant improvement on devices performances, with the great advantage of being a useful tool for controlling devices efficiency. We also find that an optimization of the emission layers thicknesses could lead to great lifetime improvement. Those results are also combined and confirmed by a Design Of Experiments meant to determine the influence of the main process parameters on devices performances. Finally, we initiate the characterization of our OLED devices using impedance spectroscopy measurements. From the modeling of single-layer structures to the understanding of simple bipolar devices through analysis of capacitive evolution of full-stack devices with time, we here show that this technic appears very useful for the understanding of charge carrier dynamic and could help reducing charge accumulation.