Conference Papers
Year : 2010
Charles Kervrann : Connect in order to contact the contributor
https://inria.hal.science/inria-00541107
Submitted on : Monday, November 29, 2010-6:35:15 PM
Last modification on : Thursday, April 11, 2024-1:08:11 PM
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Anatole Chessel, Bertrand Cinquin, François Waharte, Charles Kervrann, Jean Salamero. A detection based framework for systematic analysis of dual color TIRF microscopy. Focus on Microscopy (FOM'10), Mar 2010, Shangai, China. ⟨inria-00541107⟩
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