A detection based framework for systematic analysis of dual color TIRF microscopy - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2010
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inria-00541107 , version 1 (29-11-2010)

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  • HAL Id : inria-00541107 , version 1
  • PRODINRA : 246701

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Anatole Chessel, Bertrand Cinquin, François Waharte, Charles Kervrann, Jean Salamero. A detection based framework for systematic analysis of dual color TIRF microscopy. Focus on Microscopy (FOM'10), Mar 2010, Shangai, China. ⟨inria-00541107⟩
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