Optimality analysis of the Two-Stage Algorithm for Hammerstein system identification

Jiandong Wang Qinghua Zhang 1 Lennart Ljung
1 SISYPHE - SIgnals and SYstems in PHysiology & Engineering
Inria Paris-Rocquencourt
Abstract : The Two-Stage Algorithm (TSA) has been extensively used and adapted for the identification of Hammerstein systems. It is essentially based on a particular formulation of Hammerstein systems in the form of bilinearly parameterized linear regressions. This paper has been motivated by a somewhat contradictory fact: though the optimality of the TSA has been established by Bai in 1998 only in the case of some special weighting matrices, the unweighted TSA is usually used in practice. It is shown in this paper that the unweighted TSA indeed gives the optimal solution of the weighted nonlinear least-squares problem formulated with a particular weighting matrix. This provides a theoretical justification of the unweighted TSA, and leads to a generalization of the obtained result to the case of colored noise with noise whitening. Numerical examples of identification of Hammerstein systems are presented to validate the theoretical analysis.
Type de document :
Communication dans un congrès
SYSID 2009 - 15th IFAC Symposium on System Identification, Jul 2009, Saint Malo, France. pp.320-325, 2009, 〈10.3182/20090706-3-FR-2004.00052〉
Liste complète des métadonnées
https://hal.inria.fr/hal-00777560
Contributeur : Qinghua Zhang <>
Soumis le : jeudi 17 janvier 2013 - 16:23:16
Dernière modification le : vendredi 25 mai 2018 - 12:02:05

Lien texte intégral

openaccess

Identifiants

Collections

INRIA | INRIA-ROCQ

Citation

Jiandong Wang, Qinghua Zhang, Lennart Ljung. Optimality analysis of the Two-Stage Algorithm for Hammerstein system identification. SYSID 2009 - 15th IFAC Symposium on System Identification, Jul 2009, Saint Malo, France. pp.320-325, 2009, 〈10.3182/20090706-3-FR-2004.00052〉. 〈hal-00777560〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

71

Contact


archive-ouverte@inria.fr