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Yield Improvement by the Redundancy Method for Component Calibration

Farida Enikeeva 1 Dominique Morche 2 Alp Oguz 2
1 MISTIS - Modelling and Inference of Complex and Structured Stochastic Systems
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology
2 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
Abstract : We explore the benefits of a redundant channels methodology for the component calibration. We propose a normal approximation of the yield in order to estimate the number of redundant components needed to provide a minimal area occupied by the components.
Keywords : capacitance calibration redundancy method yield
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Farida Enikeeva, Dominique Morche, Alp Oguz. Yield Improvement by the Redundancy Method for Component Calibration. Electronics Letters, IET, 2013, 49 (13), pp.824-826. ⟨10.1049/el.2012.4170⟩. ⟨hal-00932560⟩

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