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Test Based on Built-In Current Sensors for Mixed-Signal Circuits
Abstract : This paper presents a test methodology for
mixed-signal circuits. The test approach uses a built-in sensor to
analyze the dynamic current supply of the circuit under test. This
current sensor emphasizes the highest harmonics of the dynamic current
of the circuit under test when the current to voltage conversion is
done. The goodness of the test method is analyzed first by means of a
fault simulation and afterwards through the experimental data obtained
from several benchmark circuits.
Cited literature [14 references]
https://hal.inria.fr/hal-01060778
Contributor : Hal Ifip <>
Submitted on : Thursday, November 23, 2017 - 4:29:02 PM
Last modification on : Wednesday, November 29, 2017 - 12:07:52 PM
Contributor : Hal Ifip <>
Submitted on : Thursday, November 23, 2017 - 4:29:02 PM
Last modification on : Wednesday, November 29, 2017 - 12:07:52 PM
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MozuelosLMB10.pdf
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Distributed under a Creative Commons Attribution 4.0 International License