Abstract : This paper presents a test methodology for
mixed-signal circuits. The test approach uses a built-in sensor to
analyze the dynamic current supply of the circuit under test. This
current sensor emphasizes the highest harmonics of the dynamic current
of the circuit under test when the current to voltage conversion is
done. The goodness of the test method is analyzed first by means of a
fault simulation and afterwards through the experimental data obtained
from several benchmark circuits.
Luis M. Camarinha-Matos; Pedro Pereira; Luis Ribeiro. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. Springer, IFIP Advances in Information and Communication Technology, AICT-314, pp.521-528, 2010, Emerging Trends in Technological Innovation. 〈10.1007/978-3-642-11628-5_58〉
https://hal.inria.fr/hal-01060778
Contributeur : Hal Ifip
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Soumis le : jeudi 23 novembre 2017 - 16:29:02
Dernière modification le : mercredi 29 novembre 2017 - 12:07:52
Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho. Test Based on Built-In Current Sensors for
Mixed-Signal Circuits. Luis M. Camarinha-Matos; Pedro Pereira; Luis Ribeiro. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. Springer, IFIP Advances in Information and Communication Technology, AICT-314, pp.521-528, 2010, Emerging Trends in Technological Innovation. 〈10.1007/978-3-642-11628-5_58〉. 〈hal-01060778〉
