Test Based on Built-In Current Sensors for Mixed-Signal Circuits

Abstract : This paper presents a test methodology for mixed-signal circuits. The test approach uses a built-in sensor to analyze the dynamic current supply of the circuit under test. This current sensor emphasizes the highest harmonics of the dynamic current of the circuit under test when the current to voltage conversion is done. The goodness of the test method is analyzed first by means of a fault simulation and afterwards through the experimental data obtained from several benchmark circuits.
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Communication dans un congrès
Luis M. Camarinha-Matos; Pedro Pereira; Luis Ribeiro. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. Springer, IFIP Advances in Information and Communication Technology, AICT-314, pp.521-528, 2010, Emerging Trends in Technological Innovation. 〈10.1007/978-3-642-11628-5_58〉
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho. Test Based on Built-In Current Sensors for Mixed-Signal Circuits. Luis M. Camarinha-Matos; Pedro Pereira; Luis Ribeiro. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. Springer, IFIP Advances in Information and Communication Technology, AICT-314, pp.521-528, 2010, Emerging Trends in Technological Innovation. 〈10.1007/978-3-642-11628-5_58〉. 〈hal-01060778〉

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