Abstract : This paper presents a test methodology for
mixed-signal circuits. The test approach uses a built-in sensor to
analyze the dynamic current supply of the circuit under test. This
current sensor emphasizes the highest harmonics of the dynamic current
of the circuit under test when the current to voltage conversion is
done. The goodness of the test method is analyzed first by means of a
fault simulation and afterwards through the experimental data obtained
from several benchmark circuits.
https://hal.inria.fr/hal-01060778 Contributor : Hal IfipConnect in order to contact the contributor Submitted on : Thursday, November 23, 2017 - 4:29:02 PM Last modification on : Wednesday, November 29, 2017 - 12:07:52 PM
Román Mozuelos, yolanda Lechuga, Mar Martínez, Salvador Bracho. Test Based on Built-In Current Sensors for
Mixed-Signal Circuits. First IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS), Feb 2010, Costa de Caparica, Portugal. pp.521-528, ⟨10.1007/978-3-642-11628-5_58⟩. ⟨hal-01060778⟩