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BRDF Measurements and Analysis of Retroreflective Materials

Abstract : We compare performance of various analytical retroreflecting BRDF models to assess how they reproduce accurately measured data of retroreflecting materials. We introduce a new parametrization, the back vector parametrization, to analyze retroreflecting data and we show that this parametrization better preserves the isotropy of data. Furthermore, we update existing BRDF models to improve the representation of retroreflective data.
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https://hal.inria.fr/hal-01083366
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Submitted on : Tuesday, January 6, 2015 - 10:21:46 AM
Last modification on : Thursday, March 25, 2021 - 11:42:05 AM
Long-term archiving on: : Wednesday, June 3, 2015 - 5:11:09 PM

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Laurent Belcour, Romain Pacanowski, Marion Delahaie, Aude Laville-Geay, Laure Eupherte. BRDF Measurements and Analysis of Retroreflective Materials. Journal of the Optical Society of America, Optical Society of America, 2014, JOSA A, 31 (12), pp.2561-2572. ⟨hal-01083366⟩

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