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Identifying Apple Surface Defects Based on Gabor Features and SVM Using Machine Vision
Abstract : In this paper, a novel method to recognize defect regions of apples based on Gabor wavelet transformation and SVM using machine vision is proposed. The method starts with background removal and object segmentation by threshold. Texture features are extracted from each segmented object by using Gabor wavelet transform, and these features are introduced to support vector machines (SVM) classifiers. Experimental results exhibit correctly recognized 85% of the defect regions of apples.
Cited literature [10 references]
https://hal.inria.fr/hal-01361158
Contributor : Hal Ifip Connect in order to contact the contributor
Submitted on : Tuesday, September 6, 2016 - 5:11:30 PM
Last modification on : Thursday, January 9, 2020 - 4:04:02 PM
Long-term archiving on: : Wednesday, December 7, 2016 - 2:22:22 PM
Contributor : Hal Ifip Connect in order to contact the contributor
Submitted on : Tuesday, September 6, 2016 - 5:11:30 PM
Last modification on : Thursday, January 9, 2020 - 4:04:02 PM
Long-term archiving on: : Wednesday, December 7, 2016 - 2:22:22 PM
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Distributed under a Creative Commons Attribution 4.0 International License