A View-Dependent Metric for Patch-Based LOD Generation & Selection

Thibaud Lambert 1 Pierre Bénard 1 Gael Guennebaud 1
1 MANAO - Melting the frontiers between Light, Shape and Matter
LaBRI - Laboratoire Bordelais de Recherche en Informatique, Inria Bordeaux - Sud-Ouest, LP2N - Laboratoire Photonique, Numérique et Nanosciences
Abstract : With hardware tessellation, highly detailed geometric models are decomposed into patches whose tessellation factor can be specified dynamically and independently at render time to control polygon resolution. Yet, to achieve maximum efficiency, an appropriate factor needs to be selected for each patch according to its content (geometry and appearance) and the current viewpoint distance and orientation. We propose a novel patch-based error metric that addresses this problem. It summarizes both the geometrical error and the texture parametrization deviation of a simplified patch compared to the corresponding detailed surface. This metric is compact and can be efficiently evaluated on the GPU along any view direction. Furthermore, based on this metric, we devise an easy-to-implement refitting optimization that further reduces the simplification error of any decimation algorithm, and propose a new placement strategy and cost function for edge-collapses to reach the best quality/performances trade-off.
Type de document :
Article dans une revue
Proceedings of the ACM on Computer Graphics and Interactive Techniques, ACM, 2018, 1 (1), 〈10.1145/3203195〉
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Soumis le : vendredi 27 avril 2018 - 08:56:37
Dernière modification le : jeudi 3 mai 2018 - 11:36:47

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Thibaud Lambert, Pierre Bénard, Gael Guennebaud. A View-Dependent Metric for Patch-Based LOD Generation & Selection. Proceedings of the ACM on Computer Graphics and Interactive Techniques, ACM, 2018, 1 (1), 〈10.1145/3203195〉. 〈hal-01779816〉

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