M-ary Symbol Error Outage Over Nakagami-m Fading Channels in Shadowing Environments

Philippe Mary 1 Mischa Dohler 2 Jean-Marie Gorce 3, * Guillaume Villemaud 3 Marylin Arndt 4
* Auteur correspondant
1 ETIS - Equipes Traitement de l'Information et Systèmes
2 CTTC - Centre Tecnològic de Telecomunicacions de Catalunya
3 SWING - Smart Wireless Networking
Inria Grenoble - Rhône-Alpes, CITI - CITI Centre of Innovation in Telecommunications and Integration of services
4 FT R&D - France Télécom Recherche & Développement
Abstract : This letter addresses the problem of finding a tractable expression for the symbol error outage (SEO) in flat Nakagami-m fading and shadowing channels. We deal with M-ary phase shift keying (M-PSK) and quadrature amplitude modulation (M-QAM) which extends our previous results on BPSK signaling. We propose a new tight approximation of the symbol error probability (SEP) holding for M-PSK and M-QAM signals which is accurate over all signal to noise ratios (SNRs) of interest. We derive a new generic expression for the inverse SEP which facilitates the derivation of a tight approximation of the SEO in a lognormal shadowing environment.
Keywords : M-QAM. Mobile Communications symbol error probability symbol error outage shadowing fast fading channel MPSK M-QAM
Type de document :
Article dans une revue
IEEE Transactions on Communications, Institute of Electrical and Electronics Engineers, 2009
Liste complète des métadonnées
https://hal.inria.fr/inria-00405203
Contributeur : Jean-Marie Gorce <>
Soumis le : dimanche 19 juillet 2009 - 22:56:01
Dernière modification le : vendredi 31 août 2018 - 12:48:50

Identifiants

  • HAL Id : inria-00405203, version 1

Collections

INRIA | UNIV-CERGY | IETR-INSA | INSA-LYON | IETR | UR1-UFR-ISTIC | UNIV-RENNES | ETIS | LABEXIMU

Citation

Philippe Mary, Mischa Dohler, Jean-Marie Gorce, Guillaume Villemaud, Marylin Arndt. M-ary Symbol Error Outage Over Nakagami-m Fading Channels in Shadowing Environments. IEEE Transactions on Communications, Institute of Electrical and Electronics Engineers, 2009. 〈inria-00405203〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

460

Contact


archive-ouverte@inria.fr