# Automatic and Scalable T-wise Test Case Generation Strategies for Software Product Lines

2 TRISKELL - Reliable and efficient component based software engineering
IRISA - Institut de Recherche en Informatique et Systèmes Aléatoires, Inria Rennes – Bretagne Atlantique
Abstract : Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPLs models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed all-at-once''. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on AspectOPTIMA, a concrete transactional SPL.
Type de document :
Communication dans un congrès
International Conference on Software Testing, 2010, Paris, France, France. Springer Lecture Notes in Computer Science (LNCS), 2010
Domaine :

Littérature citée [32 références]

https://hal.inria.fr/inria-00477523
Contributeur : Didier Vojtisek <>
Soumis le : jeudi 29 avril 2010 - 14:16:45
Dernière modification le : mercredi 16 mai 2018 - 11:23:06
Document(s) archivé(s) le : jeudi 30 septembre 2010 - 16:08:17

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Perrouin010a.pdf
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• HAL Id : inria-00477523, version 1

### Citation

Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon. Automatic and Scalable T-wise Test Case Generation Strategies for Software Product Lines. International Conference on Software Testing, 2010, Paris, France, France. Springer Lecture Notes in Computer Science (LNCS), 2010. 〈inria-00477523〉

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