Deep-level transient spectroscopy (DLTS) TCAD-based simulation
Abstract
Optimization of solar cells device and materials require a set of tools for the control and engineering of traps states which can be introduced during the fabrication process. Deep Level Transient Spectroscopy (DLTS) technique seems to be the most sensitive measuring method to determine electronic properties of deep levels in semiconductors. We use modern device TCAD (Technology Computer Aided Design)
simulation software to evaluate the DLTS technique. The simulated device is a silicon schottky diode.