Capturing Spatially Varying Anisotropic Reflectance Parameters using Fourier Analysis

Alban Fichet 1 Imari Sato 2 Nicolas Holzschuch 1
1 MAVERICK - Models and Algorithms for Visualization and Rendering
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, INPG - Institut National Polytechnique de Grenoble
Abstract : Reflectance parameters condition the appearance of objects in photorealistic rendering. Practical acquisition of reflectance parameters is still a difficult problem. Even more so for spatially varying or anisotropic materials, which increase the number of samples required. In this paper, we present an algorithm for acquisition of spatially varying anisotropic materials, sampling only a small number of directions. Our algorithm uses Fourier analysis to extract the material parameters from a sub-sampled signal. We are able to extract diffuse and specular reflectance, direction of anisotropy, surface normal and reflectance parameters from as little as 20 sample directions. Our system makes no assumption about the stationarity or regularity of the materials, and can recover anisotropic effects at the pixel level.
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Communication dans un congrès
Graphics Interface Conference 2016, Jun 2016, Victoria, BC, Canada. CHCCS/SCDHM, pp.65-73, 2016, <http://graphicsinterface.org/conference/2016/>
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https://hal.inria.fr/hal-01302120
Contributeur : Alban Fichet <>
Soumis le : vendredi 10 juin 2016 - 20:03:37
Dernière modification le : lundi 18 septembre 2017 - 15:00:09

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Alban Fichet, Imari Sato, Nicolas Holzschuch. Capturing Spatially Varying Anisotropic Reflectance Parameters using Fourier Analysis. Graphics Interface Conference 2016, Jun 2016, Victoria, BC, Canada. CHCCS/SCDHM, pp.65-73, 2016, <http://graphicsinterface.org/conference/2016/>. <hal-01302120v2>

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