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A physically accurate reflectance model combining reflection and diffraction

Nicolas Holzschuch 1 Romain Pacanowski 2, 3
1 MAVERICK - Models and Algorithms for Visualization and Rendering
Inria Grenoble - Rhône-Alpes, LJK - Laboratoire Jean Kuntzmann, Grenoble INP - Institut polytechnique de Grenoble - Grenoble Institute of Technology
2 MANAO - Melting the frontiers between Light, Shape and Matter
LaBRI - Laboratoire Bordelais de Recherche en Informatique, Inria Bordeaux - Sud-Ouest, LP2N - Laboratoire Photonique, Numérique et Nanosciences
Abstract : Reflectance properties express how objects in a virtual scene interact with light. They control the appearance of the object: whether it looks shiny or not, it has a metallic or plastic appearance. The reflectance model (BRDF) is essential for photorealistic pictures. Measured reflectance provide high realism, at the expense of memory cost. Parametric models are compact, but it is difficult to find the right parameters from measured reflectance. In this research report, we show that two different physical phenomena are present in measured reflectance: reflection and diffraction. Taking both into account, we present a reflectance model that is compact and a very good approximation of measured reflectance. Designers can act on model parameters, related to surface properties, to create new materials.
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Submitted on : Thursday, November 5, 2015 - 11:32:45 PM
Last modification on : Tuesday, December 21, 2021 - 12:58:02 PM
Long-term archiving on: : Saturday, February 6, 2016 - 12:10:24 PM


  • HAL Id : hal-01224702, version 1


Nicolas Holzschuch, Romain Pacanowski. A physically accurate reflectance model combining reflection and diffraction. [Research Report] RR-8807, INRIA. 2015, pp.24. ⟨hal-01224702⟩



Les métriques sont temporairement indisponibles