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Fast sampling of implicit surfaces by particle systems

Floriant Levet 1, 2 Xavier Granier 1, 2 Christophe Schlick 1, 2 
1 IPARLA - Visualization and manipulation of complex data on wireless mobile devices
INRIA Futurs, Université Sciences et Technologies - Bordeaux 1, École Nationale Supérieure d'Électronique, Informatique et Radiocommunications de Bordeaux (ENSEIRB), CNRS - Centre National de la Recherche Scientifique : UMR5800
Abstract : Particle systems, as originally proposed by Witkin and Heckbert, are a powerful way to sample implicit surfaces since they generate almost evenly distributed samples over the surface, thanks to a global minimization of an energy criterion. Nonetheless, due to the computational cost of the relaxation process, the sampling process becomes rather expensive when the number of samples exceeds a few thousands. In this paper, we propose a technique that only relies on a pure geometry processing which enables us to rapidly generate the set of final particles (e.g., half a second to generate 5,000 particles for an analytic implicit surface) with near-optimal positions. Because of its characteristics, the technique does not need the usual split-and-death criterion anymore and only about ten relaxation steps are necessary to get a high quality sampling. Either uniform or non-uniform sampling can be performed with our technique.
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Submitted on : Sunday, October 27, 2013 - 11:05:27 AM
Last modification on : Saturday, June 25, 2022 - 8:29:54 PM
Long-term archiving on: : Tuesday, January 28, 2014 - 2:55:15 AM


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Floriant Levet, Xavier Granier, Christophe Schlick. Fast sampling of implicit surfaces by particle systems. SMI '06: Proceedings of the IEEE International Conference on Shape Modeling and Applications 2006, Jun 2006, Matsushima, Japan. pp.39, ⟨10.1109/SMI.2006.13⟩. ⟨inria-00106853v2⟩



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